Services
Characterization and Research
SemiTrac can provide test, characterization, critical research, and development expertise to shorten new product development cycles and supports your pipeline of new products. SemiTrac has developed a collaborative research partnership with Tohoku University in Sendai City, Japan. Our ongoing research focus is in the area of semiconductor equipment subsystem design and performance optimization as well as improvements to solar thin film and polycrystalline Si efficiency. Process and hardware improvements in solar thin film fabrication are a high priority. Our goal is to help manufacturers meet the product roadmap requirements for cost and efficiencies.
SemiTrac conducts testing and characterization in state-of-the-art, IP-secure fab facilities (Japan, Berkeley, CA, and Silicon Valley). These facilities are ISO-9001-2000 Certified and are staffed with seasoned technology professionals. SemiTrac understands the strategic value of customer IP and ensures its protection. SemiTrac follows a rigorous non-disclosure and IP protection policy, which extends to each and every employee. All on-site workers are trained to follow our IP security program, which includes information about the importance of, and necessity of NDAs. Our research, test and foundry environments ensure the highest levels of customer confidentiality. With our experienced technical staff and state-of-the-art test equipment, SemiTrac consistently offers, dependable, cost-effective results, and rapid turnaround times— all within facilities that operate at the highest levels of quality, protection from contamination, and IP security.
Centralized data collection and monitoring
SemiTrac has designed and employs a state-of-the-art data collection and remote monitoring system that will facilitate 24x7x365 data tracking from any of our three research facilities. We are able to examine real time results at our Santa Clara, CA headquarters, with data streamed from any of our three test facilities. This capability is extremely useful for long-term reliability testing as well as for subsystem performance monitoring under varying test conditions over extended periods of time.